Manufacturers of semiconductors,
electronic displays and data storage

Boost your production performance and enhance your expertise with Smart3 Suite!
The semiconductor, electronic display, and data storage industries require process control software solutions that are powerful, flexible, and scalable. Smart3 Suite addresses the specific challenges of these sectors with a modular and customizable approach, leveraging SmartOEM3 and its specialized application modules:
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SmartMET3 for metrology
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SmartDEF3 for inspection
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SmartYIELD3 for yield optimization
Thanks to advanced Collaborative AI, Smart3 Suite automates data analysis (metrology, inspection and process) to optimize manufacturing processes, reduce variations and significantly improve yield.
With SmartOEM3, a low-code software platform, manufacturers can quickly develop and deploy customized solutions tailored to their specific manufacturing challenges. This collaborative AI facilitates the integration of human and algorithmic expertise for faster and more reliable decision-making, reducing R&D cycle costs and boosting production yields.
Creation and development of intellectual property
One of SmartOEM3's key advantages is the ability for manufacturers to develop their own proprietary solutions and thus generate distinctive intellectual property (IP). Collaborative AI makes it easier to design, test, and continuously improve specific algorithms and methodologies. This allows manufacturers to capitalize on their expertise, stand out from the competition, and strengthen their market position.
Why choose Smart3 Suite?
✔ Optimization of industrial processes (lithography, engraving, deposition, packaging, etc.)
✔ Reduced defects and improved yield
✔ Easy customization and integration
✔ Creation and valorization of intellectual property
✔ Collaborative AI for augmented decision-making
✔ Compliance with the most demanding industry standards
Our Trusted Customers

Raja Muthinti PhD,
Senior Metrology Engineering Manager, Meta Platforms
Pollen's smart technology has been instrumental in streamlining our metrology processes for AR & Smart glass exploration & development. Leveraging deep learning, Pollen's software enables scalable and adaptable structural measurements from device images. This has significantly improved our efficiency and accuracy for nanofabrication, facilitate rapid cycles of learning on novel architectures
Mehdi Daanoune,
Modeling Engineer,
Aledia
With Pollen, we were able to automate complex and time-consuming measurements, while improving the accuracy and reliability of our analyses.
The solution is extremely versatile: whether for measuring, classifying or carrying out detailed analyses, it adapts perfectly to our needs.
The solution works just as well on a small number of images as on large volumes and supports us in all phases, from engineering to production.
And what really makes the difference is the quality of the support and the constant evolution of the software, which constantly adapts to our requirements and needs.
Nicolas Feltin PhD,
Head of Materials Department,
LNE
LNE uses Smart3 for measuring nanoparticles by AFM and SEM. COFRAC certified since 2023, it integrates nanometrology segmentation tools.
Gerard Guilpain,
Scientific Director, Arkema
Arkema uses Pollen solutions to innovate in chemistry and materials. These software tools are essential to the digital transformation of its research









